Linear systems characterization of the topographical spatial resolution of optical instruments
de Groot Peter J., Daouda Zoulaiha, Deck Leslie L., Colonna de Lega Xavierinstrument transfer function (ITF), lateral resolving power, Fizeau interferometers, confocal microscopes, interference microscopes,
| Document type | Article |
| Journal title / Source | Applied Optics |
| Volume | 63 |
| Issue | 15 |
| Page numbers / Article number | 4201 |
| Publisher's name | Optica Publishing Group |
| Publisher's address (city only) | Washington, DC, United States |
| Publication date | 2024-5-17 |
| ISSN | 1559-128X, 2155-3165 |
| DOI | 10.1364/AO.521868 |
| Language | English |