Method to traceably determine the refractive index by measuring the angle of minimum deviation
Kuiper M., Koops R., Nieuwland R., van der Pol E.angle of minimum deviation, fused silica, measurement uncertainty, standardization, refractive index, traceable measurements, uncertainty budget
| Document type | Article |
| Journal title / Source | Metrologia |
| Volume | 59 |
| Issue | 5 |
| Page numbers / Article number | 055006 |
| Publisher's name | IOP Publishing |
| Publisher's address (city only) | Bristol, United Kingdom |
| Publication date | 2022-9-19 |
| ISSN | 0026-1394, 1681-7575 |
| DOI | 10.1088/1681-7575/ac8991 |
| Web URL | https://iopscience.iop.org/article/10.1088/1681-7575/ac8991/pdf |
| Language | English |