Monitoring the Electrochemical Failure of Indium Tin Oxide Electrodes via Operando Ellipsometry Complemented by Electron Microscopy and Spectroscopy
Minenkov Alexey, Hollweger Sophia, Duchoslav Jiri, Erdene-Ochir Otgonbayar, Weise Matthias, Ermilova Elena, Hertwig Andreas, Schiek ManuelaOperando Ellipsometry, Electron Microscopy, Spectroscopy, Electrochemical Failure
| Document type | Article |
| Journal title / Source | ACS Applied Materials & Interfaces |
| Volume | 16 |
| Issue | 7 |
| Page numbers / Article number | 9517-9531 |
| Publisher's name | American Chemical Society (ACS) |
| Publisher's address (city only) | Washington, DC, United States |
| Publication date | 2024-2 |
| ISSN | 1944-8244, 1944-8252 |
| DOI | 10.1021/acsami.3c17923 |
| Language | English |