Publications

Please find below selected publications from EURAMET's European Metrology Research Programmes (EMRP and EMPIR) and the Metrology Partnership that are related to Clean Energy:

Design and Implementation of Conducted Emission Reference Source

Zhao D., Teunisse G., Leferink F.B.J.
2014

Proceedings of the IEEE International Symposium on EMC, Raleigh NC, 2014 N.A. (2014) , 12-17

Type:
Article
Project title:
IND60: EMC: Improved EMC test methods in industrial environments
Name of Call / Funding Programme:
EMRP A169: Call 2012 Metrology for Industry (II)
DOI
10.1109/ISEMC.2014.6898934

Good Practice Guide: Developing Instruments with Minimal Thermal Sensitiviy

Schalles M.
2014

(2014)

Type:
Good Practice Guide
Project title:
IND13: Thermal design and dimensional drift: Thermal design and time-dependent dimensional drift behaviour of sensors, materials and structures
Name of Call / Funding Programme:
EMRP A169: Call 2010 Industry

Methods for determining piezoelectric properties of thin epitaxial films: Theoretical foundations

McCartney LNM, Wright LW, Cain MGC, Crain JC, Martyna GJM, Newns DMN
2014

Journal Applied Physics 116 (2014) , 14104

Type:
Article
Project title:
IND54: Nanostrain: Novel electronic devices based on control of strain at the nanoscale
Name of Call / Funding Programme:
EMRP A169: Call 2012 Metrology for Industry (II)
DOI
10.1063/1.4885058

Time domain methods for the analysis of conducted interference on the power supply network of complex installations

van Leersum B.J.A.M., Timens R.B., Buesink F.J.K., Leferink F.B.J.
2014

Proceedings of the 2014 International Symposium on EMC (EMC Europe) Gothenburg, Sweden N.A. (2014) , 605-610

Type:
Article
Project title:
IND60: EMC: Improved EMC test methods in industrial environments
Name of Call / Funding Programme:
EMRP A169: Call 2012 Metrology for Industry (II)
DOI
10.1109/EMCEurope.2014.6930977

Characterization of Semiconductor Materials using Synchrotron Radiation-based Near-Field Infrared Microscopy and nano-FTIR Spectroscopy

Hermann PH, Hoehl AH, Ulrich GU, Fleischmann CF, Hermelink AH, Kästner BK, Patoka PP, Hornemann AH, Beckhoff BB, Rühl ER, Ulm GU
2014

Optics Express 22 (2014) , 17948-17958

Type:
Article
Project title:
NEW01: TReND: Traceable characterisation of nanostructured devices
Name of Call / Funding Programme:
EMRP A169: Call 2011 Metrology for New Technologies
DOI
10.1364/OE.22.017948

Neutron activation analysis of the 30Si content of highly enriched 28Si: proof of concept and estimation of the achievable uncertainty

D Agostino G, Mana G, Oddone M, Prata M, Bergamaschi L, Giordani L
2014

Metrologia 51 (2014)

Type:
Article
Project title:
SIB03: kNOW Realisation of the awaited definition of the kilogram - resolving the discrepancies
Name of Call / Funding Programme:
EMRP A169: Call 2011 SI Broader Scope
DOI
10.1088/0026-1394/51/3/354

Performance verification of a dual sensor stage

Yacoot A., Mountford J., Tedaldi M., Reid B., Levy S.
2014

Proceedings of the 14th euspen International Conference – Dubrovnik – June 2014 I (2014) , P4.38, 309V1

Type:
Proceedings
Project title:
IND58: 6DoF: Metrology for movement and positioning in six degrees of freedom
Name of Call / Funding Programme:
EMRP A169: Call 2012 Metrology for Industry (II)

A 5 degrees of freedom μCMM

Küng A., Meli F., Nicolet A.
2014

Proceedings of the 14th international conference of the european society for precision engineering and nanotechnology II (2014) , P4.28, 269V1

Type:
Proceedings
Project title:
IND58: 6DoF: Metrology for movement and positioning in six degrees of freedom
Name of Call / Funding Programme:
EMRP A169: Call 2012 Metrology for Industry (II)

Projekt EMPR JRP ENV07 Metrologia dla meteorologii zakończony

Szmyrka-Grzebyk A, Grudniewicz E, Grykałowska A, Kowal A, Kołodziej B, Wełna A, Kozicki M, Wiśniewska B
2014

Metrologia i Probiernictwo 4 (7) (2014) , 34-39

Type:
Article
Project title:
ENV07: MeteoMet: Metrology for pressure, temperature, humidity and airspeed in the atmosphere
Name of Call / Funding Programme:
EMRP A169: Call 2010 Environment

In-beam tracking refractometry for coordinate interferometric measurement

Holá M., Lazar J., Cip O., Buchta Z.
2014

Proceddings SPIE 9132, Optical Micro- and Nanometrology V 9132 (2014)

Type:
Proceedings
Project title:
IND58: 6DoF: Metrology for movement and positioning in six degrees of freedom
Name of Call / Funding Programme:
EMRP A169: Call 2012 Metrology for Industry (II)
DOI
10.1117/12.2052920