Publications

Optical Spin-Transfer-Torque-Driven Domain-Wall Motion in a Ferromagnetic Semiconductor

Roy P. E., Ramsay A. J., Otxoa R. M., Haigh J. A., Campion R. P., Janda T., Irvine A. C., Wunderlich J., Gallagher B. L.

2015

Physical Review Letters 114 (2015)

Type:: Article
Project title:: EXL04: SpinCal: Spintronics and spin-caloritronics in magnetic nanosystems
Name of Call / Funding Programme:: EMRP A169: Call 2012 Open excellence call
DOI: 10.1103/PhysRevLett.114.067202

Scattering of two photons on a quantum emitter in a one-dimensional waveguide: exact dynamics and induced correlations

Nysteen Anders, Kristensen Philip Trøst, McCutcheon Dara P S, Kaer Per, Mørk Jesper

2015

New Journal of Physics 17 (2015) , 023030

Type:: Article
Project title:: EXL02: SIQUTE: Single-photon sources for quantum technologies
Name of Call / Funding Programme:: EMRP A169: Call 2012 Open excellence call
DOI: 10.1088/1367-2630/17/2/023030

Electrode size and boundary condition independent measurement of the effective piezoelectric coefficient of thin films

Stewart MS, Lepadatu SL, McCartney LNM, Cain MGC, Wright LW, Crain JC, Newns DMN, Martyna GJM

2015

APL Materials 3 (2015) , 026103

Type:: Article
Project title:: IND54: Nanostrain: Novel electronic devices based on control of strain at the nanoscale
Name of Call / Funding Programme:: EMRP A169: Call 2012 Metrology for Industry (II)
DOI: 10.1063/1.4907954

A systematic study of Ga+ implantation into PZT films

Wollschläger N., Österle W., Stewart M.

2015

Physica Status Solidi C 12 (2015) , 314-317

Type:: Article
Project title:: NEW05: MechProNO: Traceable measurement of mechanical properties of nano-objects
Name of Call / Funding Programme:: EMRP A169: Call 2011 Metrology for New Technologies
DOI: 10.1002/pssc.201400096

Reference-free, depth-dependent characterization of nanolayers and gradient systems with advanced grazing incidence X-ray fluorescence analysis

Honicke P., Detlefs B., Muller M., Darlatt E., Nolot E., Grampeix H., Beckhoff B.

2015

pss(a) - ALTECH Proc 212 (2015) , 523-528

Type:: Article
Project title:: NEW01: TReND: Traceable characterisation of nanostructured devices
Name of Call / Funding Programme:: EMRP A169: Call 2011 Metrology for New Technologies
DOI: 10.1002/pssa.201400204

Precision measurement of a potential-profile tunable single-electron pump

Bae M.-H., Ahn Y.-H., Seo M., Chung Y., Fletcher J. D., Giblin S. P., Kataoka M., Kim N.

2015

Metrologia 52 (2015) , 195-200

Type:: Article
Project title:: SIB07: Qu-Ampere: Quantum ampere: Realisation of the new SI ampere
Name of Call / Funding Programme:: EMRP A169: Call 2011 SI Broader Scope
DOI: 10.1088/0026-1394/52/2/195

Surface Layer Analysis of Si Sphere by XRF and XPS

Zhang L. Z., Azuma Y. A., Kurokawa A. K., Kuramoto N. K., Fujii K. F.

2015

IEEE Transaction on Instrumentation and Measurement 64 (2015) , 1509-1513

Type:: Article
Project title:: SIB03: kNOW Realisation of the awaited definition of the kilogram - resolving the discrepancies
Name of Call / Funding Programme:: EMRP A169: Call 2011 SI Broader Scope
DOI: 10.1109/TIM.2015.2389352

Quantities affecting the behavior of vibrational magnetostrictive transducers

Zucca Mauro, Hadadian Arash, Bottauscio Oriano

2015

IEEE Transactions on Magnetics 51 (2015)

Type:: Article
Project title:: ENG02: Harvesting: Metrology for Energy Harvesting
Name of Call / Funding Programme:: EMRP A169: Call 2009 Energy
DOI: 10.1109/TMAG.2014.2359248

Precise scalar calibration of a tri-axial Braunbek coil system

Zikmund A., Ripka P., Ketzler R., Harcken H., Albrecht M.

2015

IEEE Transactions on Magnetics 51 (2015)

Type:: Article
Project title:: IND08: MetMags: Metrology for Advanced Industrial Magnetics
Name of Call / Funding Programme:: EMRP A169: Call 2010 Industry
DOI: 10.1109/TMAG.2014.2357783

The Matrix Effect in Organic Secondary Ion Mass Spectrometry

Shard A.G., Spencer S.J., Smith S.A., Havelund R., Gilmore I.S.

2015

International Journal of Mass Spectrometry 377 (2015) , 599-609

Type:: Article
Project title:: NEW01: TReND: Traceable characterisation of nanostructured devices
Name of Call / Funding Programme:: EMRP A169: Call 2011 Metrology for New Technologies
DOI: 10.1016/j.ijms.2014.06.027