The Propagation Constant of Coaxial Offset Shorts with Rough Surfaces
Hoffmann J,
Ruefenacht J,
Zeier M
2016
CPEM 2014 Digest
2014
(2016)
, 14-15
Type:
Proceedings
Project title:
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme:
EMRP A169: Call 2012 SI Broader scope (II)
Comparison of methods for measurement of equivalent source match
Hoffmann J,
Wollensack M,
Ruefenacht J,
Zeier M
2016
Proceedings of the 45th European Microwave Conference
2015
(2016)
, 730-733
Type:
Proceedings
Project title:
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme:
EMRP A169: Call 2012 SI Broader scope (II)
Extended S-parameters for imperfect test ports
Hoffmann J,
Wollensack M,
Ruefenacht J,
Zeier M,
Zeier Markus
2016
Metrologia
52
(2016)
, 121-129
Type:
Article
Project title:
SIB62: HFCircuits: Metrology for new electrical measurement quantities in high-frequency circuits
Name of Call / Funding Programme:
EMRP A169: Call 2012 SI Broader scope (II)
Generation of Whole-Body Scintigraphic Images with New GATE Output Capacities
Garcia MP,
Villoing D,
McKay E,
Ferrer L,
Der Sarkissian H,
Poirot M,
Bardiès M
2016
IEEE Nuclear Science Symposium and Medical Imaging Conference
(2013 NSS/MIC), Seoul, 2013
(2016)
, pp. 1-3.
Type:
Article
Project title:
HLT11: MetroMRT: Metrology for molecular radiotherapy
Name of Call / Funding Programme:
EMRP A169: Call 2011 Metrology for Health
Modelling of interband transitions in GaAs tunnel diode
Louarn KL,
Fontain CF,
Arnoult AA,
Olivié FO,
Lacoste GL,
Piquemal FP,
Bounouh AB,
Almuneau GA
2016
Semiconductor Science and Technology
31
(2016)
, 1-5
Type:
Article
Project title:
ENG51: SolCell: Metrology for III-V materials based high efficiency multi-junction solar cells
Name of Call / Funding Programme:
EMRP A169: Call 2013 Energy II
Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors
Fleischmann C.,
Conard T.,
Havelund R.,
Franquet A.,
Poleunis C.,
Voroshazi E.,
Delcorte A.,
Vandervorst W.
2016
Surface and Interface Analysis
1
(2016)
, 54-57
Type:
Article
Project title:
NEW01: TReND: Traceable characterisation of nanostructured devices
Name of Call / Funding Programme:
EMRP A169: Call 2011 Metrology for New Technologies