Robustness of single-electron pumps at sub-ppm current accuracy level
Stein F,
Scherer H,
Gerster T,
Behr R,
Götz M,
Pesel E,
Leicht C,
Ubbelohde N,
Weimann T,
Pierz K,
Schumacher H W,
Hohls F
2016
Metrologia
54
(2016)
, S1-S8
Type:
Article
Project title:
15SIB08: e-SI-Amp: Quantum realisation of the SI ampere
Name of Call / Funding Programme:
EMPIR 2015: SI Broader Scope
Traceable Coulomb blockade thermometry
Hahtela O,
Mykkänen E,
Kemppinen A,
Meschke M,
Prunnila M,
Gunnarsson D,
Roschier L.,
Penttilä J,
Pekola J
2016
Metrologia
54
(2016)
, 69-76
Type:
Article
Project title:
15SIB02: InK 2: Implementing the new kelvin 2
Name of Call / Funding Programme:
EMPIR 2015: SI Broader Scope
Alternative Conducted Immunity Tests
Çakır Soydan,
Şen Osman,
ACAK Savaş,
AZPURUA Marco,
SILVA Ferran,
Çetintaş Mustafa
2016
IEEE Electromagnetic Compatibility Magazine
5
(2016)
, 45-51
Type:
Article
Project title:
IND60: EMC: Improved EMC test methods in industrial environments
Name of Call / Funding Programme:
EMRP A169: Call 2012 Metrology for Industry (II)
Influencia del Tamaño de Pigmento en la Distancia de Detección del Sparkle
Gómez O.,
Perales E.,
Chorro E.,
Viqueira V.,
Martínez-Verdú F.M.,
Ferrero A.,
Campos J.
2016
Resumen de la Contribuciones. XI Reunión Nacional de Óptica
1
(2016)
, 168
Type:
Proceedings
Project title:
IND52: xDReflect: Multidimensional reflectometry for industry
Name of Call / Funding Programme:
EMRP A169: Call 2012 Metrology for Industry (II)
Evaluación de la fórmula de diferencia de color AUDI2000: análisis del croma
Perales E.,
Chorro E.,
Gómez O.,
Viqueira V.,
Martínez-Verdú F.M.,
Gómez-Robledo L.,
Melgosa M.
2016
Resúmenes de las contribuciones. XI Reunión Nacional de Óptica
1
(2016)
, 171
Type:
Proceedings
Project title:
IND52: xDReflect: Multidimensional reflectometry for industry
Name of Call / Funding Programme:
EMRP A169: Call 2012 Metrology for Industry (II)