Novel Broadband THz-Detector
Muller Ralf,
Kehrt Mathias,
Monte Christian,
Steiger Andreas,
Bohmeyer Werner,
Lange Karsten
2013
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2013, 38th International Conference on
(2013)
, 2
Type:
Article
Project title:
NEW07: THz Security: Microwave and terahertz metrology for homeland security
Name of Call / Funding Programme:
EMRP A169: Call 2011 Metrology for New Technologies
IN-SITU TRACEABLE CHARACTERIZATION OF THE DEPTH SENSING SYSTEM OF A NANOINDENTATION INSTRUMENT
Li ZL,
Brand UB,
Popadic RP
2013
11th International Symposium on Measurement and Quality Control 2013
11th International Symposium on Measurement and Quality Control 2013
(2013)
, 1-4
Type:
Proceedings
Project title:
IND05: MeProVisc: Dynamic Mechanical Properties and Long-term Deformation Behaviour of Viscous Materials
Name of Call / Funding Programme:
EMRP A169: Call 2010 Industry
Universal ear simulator: Specifications and artificial ear canal design
Lavergne T,
Rodrigues D,
Neimanns V,
Sandermann Olsen E,
Barham R
2013
InterNoise 2013
5
(2013)
, 3882-3889
Type:
Article
Project title:
HLT01: Ears: Metrology for a universal ear simulator and the perception of non-audible sound
Name of Call / Funding Programme:
EMRP A169: Call 2011 Metrology for Health
Establishing traceability for the quantity sound power
Wittstock V,
Schmelzer M,
Bethke C
2013
(2013)
, 3547 to 3551
Type:
Proceedings
Project title:
SIB56: SoundPwr: Realisation, dissemination and application of the unit watt in airborne sound
Name of Call / Funding Programme:
EMRP A169: Call 2012 SI Broader scope (II)
Pre-Launch Calibration of Space Instrumentation from 100 GHz to 1 THz
Miall JM,
Dudley AD,
Protheroe SJP
2013
Millimeter Waves and THz Technology Workshop (UCMMT), 2013 6th UK, Europe, China
(2013)
, 1-2
Type:
Proceedings
Project title:
ENV04: MetEOC: European metrology for earth observation and climate
Name of Call / Funding Programme:
EMRP A169: Call 2010 Environment
Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry
Petrik PP,
Gumprecht TG,
Nutsch AN,
Roeder GR,
Lemberger ML,
Juhasz GJ,
Polgar OP,
Major CM,
Kozma PK,
Janosov MJ,
Fodor BF,
Agocs EA,
Fried MF
2013
Thin Solid Films
541
(2013)
, 131-135
Type:
Article
Project title:
IND07: Thin Films: Metrology for the manufacturing of thin films
Name of Call / Funding Programme:
EMRP A169: Call 2010 Industry
Development of Near-field Microwave Methods for NEMS Resonators
Hao L,
Goniszewski S,
Gallop J,
Chen J
2013
13th IEEE Conference on Nanotechnology (IEEE-NANO)
n/a
(2013)
, 379 - 383
Type:
Proceedings
Project title:
NEW08: MetNEMS: Metrology with/for NEMS
Name of Call / Funding Programme:
EMRP A169: Call 2011 Metrology for New Technologies
