Optical characterisation of patterned thin films
Rosu DR,
Petrik PP,
Rattmann GR,
Schellenberger MS,
Beck UB,
Hertwig AH
2014
Thin Solid Films
571
(2014)
, 601-604
Type:
Article
Project title:
IND07: Thin Films: Metrology for the manufacturing of thin films
Name of Call / Funding Programme:
EMRP A169: Call 2010 Industry
Characterization of thin film thickness
Pourjamal SP,
Mäntynen HM,
Jaanson PJ,
Rosu DMR,
Hertwig AH,
Manoocheri FM,
Ikonen EI
2014
Metrologia
51
(2014)
, S302-S308
Type:
Article
Project title:
IND07: Thin Films: Metrology for the manufacturing of thin films
Name of Call / Funding Programme:
EMRP A169: Call 2010 Industry
Design and Fabrication of Coupled NanoSQUIDs and NEMS
Bechstein S,
Ruede F,
Drung D,
Storm J.-H.,
Köhn C,
Kieler O. F.,
Kohlmann J.,
Weimann T.,
Patel T,
Li B,
Cox D,
Gallop J. C.,
Hao L.,
Schurig T
2014
IEEE Transactions on Applied Superconductivity
25
(2014)
, 1602604
Type:
Article
Project title:
NEW08: MetNEMS: Metrology with/for NEMS
Name of Call / Funding Programme:
EMRP A169: Call 2011 Metrology for New Technologies
New source and detector technology for the realization of photometric units
Timo Dönsberg T.,
Tomi Pulli T.,
Tuomas Poikonen T.,
Hans Baumgartner H.,
Anna Vaskuri A.,
Meelis Sildoja M.,
Farshid Manoocheri F.,
Petri Kärhä P.,
Erkki Ikonen E.
2014
Metrologia
51
(2014)
, 197-202
Type:
Article
Project title:
SIB57: NEWSTAR: New primary standards and traceability for radiometry
Name of Call / Funding Programme:
EMRP A169: Call 2012 SI Broader scope (II)
Metrology for industrial quantum communications: the MIQC project
Rastello M L,
Degiovanni I P,
Sinclair A G,
Kück S,
Chunnilall C J,
Porrovecchio G,
Smid M,
Manoocheri F,
Ikonen E,
Kubarsepp T,
Stucki D,
Hong K S,
Kim S K,
Tosi A,
Brida G,
Meda A,
Piacentini F,
Traina P,
Al Natsheh A,
Cheung J Y,
Müller I,
Klein R,
Vaigu A
2014
Metrologia
51
(2014)
, 10
Type:
Article
Project title:
IND06: MIQC: Metrology for industrial quantum communication technologies
Name of Call / Funding Programme:
EMRP A169: Call 2010 Industry