The gateway to Europe's
integrated metrology community.

Welcome to the EURAMET Repository Link

The EURAMET Repository Link is an online service providing links to scientific papers and datasets published within the European Partnership on Metrology (Partnership), the European Metrology Programme for Innovation and Research (EMPIR), the European Metrology Research Programme (EMRP), and projects funded by iMERA-Plus.

References
Improving the traceability chain in geodetic length measurement by the new robust interferometer TeleYAG
Bošnjakovic A., Pollinger F., Meiners–Hagen K.
2015

Proceedings 19th International Research/Expert Conference "Trends in the Development of Machinery and Associated Technology" 19 (2015) , 117-120

Type: Proceedings
Project title: SIB60: Surveying: Metrology for long distance surveying
Name of Call / Funding Programme: EMRP A169: Call 2012 SI Broader scope (II)
Fast Simulation Method for Parameter Reconstruction in Optical Metrology
Burger S., Zschiedrich L., Pomplun J., Schmidt F., Bodermann B.
2015

Proc SPIE 8681 (2015)

Type: Proceedings
Project title: IND17: Scatterometry: Metrology of small structures for the manufacturing of electronic and optical devices
Name of Call / Funding Programme: EMRP A169: Call 2010 Industry
Scatterometry sensitivity analysis for conical diffraction versus in-plane diffraction geometry with respect to the side wall angle
Soltwisch V., Burger S., Scholze F.
2015

Proc SPIE 8789 (2015)

Type: Proceedings
Project title: IND17: Scatterometry: Metrology of small structures for the manufacturing of electronic and optical devices
Name of Call / Funding Programme: EMRP A169: Call 2010 Industry
18F primary standard at ENEA-INMRI by three absolute techniques and calibration of a well-type IG11 ionization chamber
CAPOGNI M.C., CARCONI P.C., De FELICE P.DF., FAZIO A.F.
2015

Applied Radiation and Isotopes 109 (2015) , 410-413

Type: Article
Project title: HLT11: MetroMRT: Metrology for molecular radiotherapy
Name of Call / Funding Programme: EMRP A169: Call 2011 Metrology for Health
The effect of line roughness on DUV scatterometry.
Henn M.-A., Heidenreich S., Groß H., Bodermann B., Baer M.
2015

Proc SPIE 8789 (2015)

Type: Proceedings
Project title: IND17: Scatterometry: Metrology of small structures for the manufacturing of electronic and optical devices
Name of Call / Funding Programme: EMRP A169: Call 2010 Industry
Nanometrology on Gratings with GISAXS: FEM Reconstruction and Fourier Analysis
Soltwisch V., Wernecke J., Haase A., Probst J., Schoengen M., Krumrey M., Scholze F.
2015

Proc SPIE (2015)

Type: Proceedings
Project title: IND17: Scatterometry: Metrology of small structures for the manufacturing of electronic and optical devices
Name of Call / Funding Programme: EMRP A169: Call 2010 Industry
Measurement comparison of goniometric scatterometry and coherent Fourier scatterometry
Endres J., Kumar N., Petrik P., Henn M.-A., Heidenreich S., Pereira S. F., Urbach H. P., Bodermann B.
2015

Proc SPIE 9132 (2015)

Type: Proceedings
Project title: IND17: Scatterometry: Metrology of small structures for the manufacturing of electronic and optical devices
Name of Call / Funding Programme: EMRP A169: Call 2010 Industry
From Real-Time SAR Assessment to Temperature Distributions in Coronary Stents at 7T
Winter Lukas, Oberacker Eva, Özerdem Celal, Ji Yiyi, von Knobelsdorff-Brenkenhoff Florian, Weidemann Gerd, Ittermann Bernd, Seifert Frank, Niendorf Thoralf
2015

Proc. Intl. Soc. Mag. Reson. Med. 23 (2015)

Type: Proceedings
Project title: HLT06: MRI safety: Metrology for next-generation safety standards and equipment in MRI
Name of Call / Funding Programme: EMRP A169: Call 2011 Metrology for Health
Fibre optics wavemeters calibration using a self-referenced optical frequency comb
Galindo-Santos J., Velasco A. V., Corredera P.
2015

Review of Scientific Instruments 86 (2015)

Type: Article
Project title: IND14: Frequency: New generation of frequency standards for industry
Name of Call / Funding Programme: EMRP A169: Call 2010 Industry
Development of a scatterometry reference standard
Bodermann B., Loechel B., Scholze F., Dai G., Wernecke J., Endres J., Probst J., Schoengen M., Krumrey M., Hansen P.-E., Soltwisch V.
2015

Proc SPIE 9132 (2015)

Type: Proceedings
Project title: IND17: Scatterometry: Metrology of small structures for the manufacturing of electronic and optical devices
Name of Call / Funding Programme: EMRP A169: Call 2010 Industry
5740 RESULT(S)